Experimental evidence of cut-wire-induced enhanced transmission of transverse-electric fields through sub-wavelength slits in a thin metallic screen

摘要

Recent numerical studies have demonstrated the possibility of achievingsubstantial enhancements in the transmission of transverse-electric-polarizedelectromagnetic fields through subwavelength slits in a thin metallic screen byplacing single or paired metallic cut-wire arrays at a close distance from thescreen. In this Letter, we report on the first experimental evidence of suchextraordinary transmission phenomena, via microwave (X/Ku-band) measurements onprinted-circuit-board prototypes. Experimental results agree very well withfull-wave numerical predictions, and indicate an intrinsic robustness of theenhanced transmission phenomena with respect to fabrication tolerances andexperimental imperfections.